Witnesss sample IR, CaF2 witness sample, Sapphire witness sample, ZnSe witness sample, Germanium witness sample, silicon witness sample

Witness Sample, Transmission, IR

Esco PN:
  • $ 3950

Esco Optics witness samples used for transmission are precision polished on both sides to a scratch dig of 60-40. Flatness of each side is < 1 wave @ 633nm at 80% CA. Parallelism < 1 arc min. Witness sample diameter is 25.40mm and the thickness is 1.50mm. All materials are fabricated from single crystals. Edges are safety beveled. 

The refractive index values listed are representative of nd at 587nm. 

Diameter 25.40 mm +\-0.10
Thickness  1.50 mm +/-0.25
Flatness < 1.0 wave @ 633nm 
Surface Quality 60-40 scratch-dig
Edges Fine ground and beveled
Materials CaF2, Sapphire, ZnSe, Germanium, Silicon


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