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Witness Sample, Reflection, 1.400-1.899
Esco PN:Esco Optics witness samples used for reflection are precision polished on one side to a scratch dig of 60-40. Flatness is < 1 wave @ 633nm at 80% CA. The second side is ground. Parallelism < 1 arc min. Edges are safety beveled. Witness sample diameter is 25.40mm and the thickness is 1.50mm.
All of our witness samples are melt lot controlled and individual melt data is available on request. The refractive index values listed are representative of nd at 587nm.
| Diameter | 25.40 mm +/-0.10 |
| Thickness | 1.50 mm +/-0.25 |
| Flatness | < 1.0 wave @ 633nm |
| Surface Quality | 60-40 scratch-dig |
| Edges | Fine ground and beveled |
| Materials info | S-BSL7, UV Fused Silica, S-FPL53, SF-11, SF-57 |
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